CORRELATION BETWEEN FREE-CLUSTER PROPERTIES AND THIN FILMS ELABORATED BY LOW-ENERGY CLUSTER-BEAM DEPOSITION

P. Mélinon, V. Paillard, V. Dupuis, J.P. Perez, J. Tuaillon, A. Perez, B. Barbara, L. Thomas and M. Boudeulle
Additional contact information
P. Mélinon: Département de Physique des Matériaux, 43 Bd du 11 Nov 1918, F-69622 Villeurbanne Cedex, France
V. Paillard: Département de Physique des Matériaux, 43 Bd du 11 Nov 1918, F-69622 Villeurbanne Cedex, France
V. Dupuis: Département de Physique des Matériaux, 43 Bd du 11 Nov 1918, F-69622 Villeurbanne Cedex, France
J.P. Perez: Département de Physique des Matériaux, 43 Bd du 11 Nov 1918, F-69622 Villeurbanne Cedex, France
J. Tuaillon: Département de Physique des Matériaux, 43 Bd du 11 Nov 1918, F-69622 Villeurbanne Cedex, France
A. Perez: Département de Physique des Matériaux, 43 Bd du 11 Nov 1918, F-69622 Villeurbanne Cedex, France
B. Barbara: Laboratoire de Magnétisme Laboratoire Louis Néel, CNRS BP 166X, 38042 Grenoble Cedex, France
L. Thomas: Laboratoire de Magnétisme Laboratoire Louis Néel, CNRS BP 166X, 38042 Grenoble Cedex, France
M. Boudeulle: Laboratoire de Physico-Chimie des Matériaux Luminescents, 43 Bd du 11 Nov 1918, F-69622 Villeurbanne Cedex, France

Surface Review and Letters (SRL), 1996, vol. 03, issue 01, 1007-1011

Abstract: The properties of thin films obtained by low-energy cluster-beam deposition are reviewed. The main characteristics are the nanoscale granular structure and the memory effect of the free-cluster properties. The first point is evidenced by the specific magnetic properties of transition-metal films, which are intermediate between amorphous and bulk phases, while the second point is illustrated from carbon films exhibiting the electronic structure of the free carbon cluster.

Date: 1996
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DOI: 10.1142/S0218625X96001807

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