CHARACTERIZATION AND OPTICAL PROPERTIES OFAu/SiO2COMPOSITE THIN FILMS

I. Tanahashi, M. Yoshida, Y. Manabe and T. Tohda
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I. Tanahashi: Central Research Laboratories, Matsushita Electric Industrial Co. Ltd., Hikaridai, Seika-cho, Kyoto 619–02, Japan
M. Yoshida: Central Research Laboratories, Matsushita Electric Industrial Co. Ltd., Hikaridai, Seika-cho, Kyoto 619–02, Japan
Y. Manabe: Central Research Laboratories, Matsushita Electric Industrial Co. Ltd., Hikaridai, Seika-cho, Kyoto 619–02, Japan
T. Tohda: Central Research Laboratories, Matsushita Electric Industrial Co. Ltd., Hikaridai, Seika-cho, Kyoto 619–02, Japan

Surface Review and Letters (SRL), 1996, vol. 03, issue 01, 1071-1076

Abstract: Au/SiO2composite thin films were prepared by a multitarget sputtering method. The multilayer structure where the Au-particle layer was sandwiched betweenSiO2layer was clearly observed in the as-deposited film by the cross-sectional TEM. The diameter of the Au particles in the film was estimated to be 2–3 nm and it began to increase when the film was heat-treated above 700° C. The diameter was proportional to the cube root of the heat-treatment time, suggesting that the Au particles grew in the supersaturated solid solution. In the optical absorption spectra of the films, the absorption peak due to the surface-plasmon resonance of Au particles was observed at the wavelength of 528–544 nm. With increasing mean diameter of Au particles, the peak intensity became large and the full-width-at-half-maximum of the absorption band was decreased from 130 nm to 80 nm.

Date: 1996
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DOI: 10.1142/S0218625X96001911

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