DEFECTS OF A15 SMALL PARTICLES IN TUNGSTEN THIN FILMS

Masashi Arita and Isao Nishida
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Masashi Arita: School of Engineering and Furo-cho Chikusa-ku, Nagoya 464–01, Japan
Isao Nishida: Faculty of Science, Nagoya University, Furo-cho Chikusa-ku, Nagoya 464–01, Japan

Surface Review and Letters (SRL), 1996, vol. 03, issue 01, 1191-1194

Abstract: Crystal defects of A15 small particles in tungsten thin films were studied by means of transmission electron microscopy. Defects found in nanoscale crystals were analyzed to have special structure containing theZr4Al3-type structure unit.

Date: 1996
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DOI: 10.1142/S0218625X9600214X

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