ULTRATHIN PSEUDOMORPHIC FILMS: STRUCTURE DETERMINATION AND STRAIN ANALYSIS

F. Jona and P. M. Marcus
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F. Jona: Department of Materials Science and Engineering, State University of New York, Stony Brook, New York 11794–2275, USA
P. M. Marcus: Department of Materials Science and Engineering, State University of New York, Stony Brook, New York 11794–2275, USA

Surface Review and Letters (SRL), 1996, vol. 03, issue 02, 1285-1294

Abstract: This paper is a review of the procedure followed in studies of ultrathin pseudomorphic films by means of quantitative analysis of low-energy electron diffraction intensities and subsequent strain analysis of the bulk. Two examples are discussed in detail: (FeonRh{001}), for the case in which the unit mesh of the substrate surface and the unit mesh of the growth plane of the film material are similar and differ only in size (so-called Case-1 epitaxy); and [Co onTiAl(010)], for the case in which the two unit meshes are not similar, but differ from one another in both shape and size (so-called Case-2 epitaxy). Both examples show that these procedures can use the measured bulk strain to discriminate between body-centered-cubic and face-centered-cubic structures for the equilibrium phase of the epitaxial film.

Date: 1996
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DOI: 10.1142/S0218625X96002291

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