KINETICS, DYNAMICS AND MUTUAL INTERACTIONS OF DEFECTS ON Si(001)

Zhenyu Zhang, Fang Wu and Max G. Lagally
Additional contact information
Zhenyu Zhang: Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6032, USA
Fang Wu: University of Wisconsin, Madison, WI 53706, USA
Max G. Lagally: University of Wisconsin, Madison, WI 53706, USA

Surface Review and Letters (SRL), 1996, vol. 03, issue 03, 1449-1462

Abstract: This article gives a critical review of the recent progress in the understanding of the physical properties of defects on Si(001). Mainly two classes of defects will be considered: point defects, including adatoms, ad-dimers, atom vacancies and dimer vacancies; and line defects, including steps, dimer strings, antiphase boundaries and vacancy lines. The focus will be on the kinetic and dynamic properties of the defects. Also discussed are their mutual interactions. A combination of extensive theoretical and experimental studies has provided clear answers to several fundamental questions about defect energetics and dynamics, and in some other cases has resulted in plausible solutions. In surveying some open or controversial issues, likely future directions will be discussed as well.

Date: 1996
References: Add references at CitEc
Citations:

Downloads: (external link)
http://www.worldscientific.com/doi/abs/10.1142/S0218625X96002461
Access to full text is restricted to subscribers

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:03:y:1996:i:03:n:s0218625x96002461

Ordering information: This journal article can be ordered from

DOI: 10.1142/S0218625X96002461

Access Statistics for this article

Surface Review and Letters (SRL) is currently edited by S Y Tong

More articles in Surface Review and Letters (SRL) from World Scientific Publishing Co. Pte. Ltd.
Bibliographic data for series maintained by Tai Tone Lim ().