INVESTIGATION OF SYMMETRY PROPERTIES OF SURFACES BY MEANS OF BACKSCATTERED ELECTRONS

M. Erbudak, M. Hochstrasser, E. Wetli and M. Zurkirch
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M. Erbudak: Laboratorium für Festkörperphysik, Eidgenössische Technische Hochschule, CH-8093 Zürich, Switzerland
M. Hochstrasser: Laboratorium für Festkörperphysik, Eidgenössische Technische Hochschule, CH-8093 Zürich, Switzerland
E. Wetli: Laboratorium für Festkörperphysik, Eidgenössische Technische Hochschule, CH-8093 Zürich, Switzerland;
M. Zurkirch: Laboratorium für Festkörperphysik, Eidgenössische Technische Hochschule, CH-8093 Zürich, Switzerland

Surface Review and Letters (SRL), 1997, vol. 04, issue 01, 179-196

Abstract: Secondary-electron imaging is presented as a practical method which allows investigation of the near-surface structure in real time. It is based on the observation that electrons backscattered from surfaces in the keV range show a strong enhancement of intensity along directions defined by atomic rows. The spatial imaging of such electrons reveals the symmetry of near-surface regions in real space. Three-dimensional views of the solid are readily obtained, which makes this method ideally suited for the study of unknown structures and any material system where there is a change of symmetry.

Date: 1997
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DOI: 10.1142/S0218625X97000183

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