CALCULATION OF LATERAL FORCE COMPONENTS IN AFM CONTACT MODE IN APPLICATION TO THE DIAGNOSTIC OF POINT DEFECTS

E. V. Blagov, G. L. Klimchitskaya and V. M. Mostepanenko
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E. V. Blagov: Research and Innovation Enterprise "Modus," Moscow, Russia
G. L. Klimchitskaya: North-West Polytechnical Institute, Department of Physics, Millionnaya str. 5, 191065, St. Petersburg, Russia;
V. M. Mostepanenko: St. Petersburg State Technological Institute (Technical University), Department of Mathematics, Moskowsky pr. 26, 198013, St. Petersburg, Russia;

Surface Review and Letters (SRL), 1997, vol. 04, issue 02, 271-278

Abstract: Lateral force components are calculated when scanning the AFM tip above the surface of close-packed structure in contact mode. Both the case of the perfect surface and of the surface with point defects of different types are considered. It is shown that the lateral force profiles give the essential information which enables one not only to determine the point defect position but also to ascertain the type of defect.

Date: 1997
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DOI: 10.1142/S0218625X97000250

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