POLARIZATION-DEPENDENT SOFT X-RAY SPECTROSCOPIES

Maurizio Sacchi
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Maurizio Sacchi: LURE Université Paris-Sud, 91405 Orsay, France

Surface Review and Letters (SRL), 1997, vol. 04, issue 02, 343-352

Abstract: A short overview is given of recent developments in the use of polarized X-rays. A few studies are chosen to exemplify the possible applications and the common underlying ideas of different spectroscopic techniques in the domain of soft X-rays. The analysis of resonant reflectivity of polarized X-rays from a magnetic sample is discussed in more detail.

Date: 1997
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DOI: 10.1142/S0218625X97000341

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