AFM OPERATING MODE WITH A CONSTANT FORCE PROJECTION ONTO THE ARBITRARY AXIS
V. B. Bezerra,
E. V. Blagov,
G. L. Klimchitskaya () and
V. M. Mostepanenko
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V. B. Bezerra: Departamento de Física, Universidade Federal da Paraí ba, Caixa Postal 5008, CEP 58.059-970 João Pessoa, Pb, Brazil
E. V. Blagov: Research and Innovation Enterprise "Modus," Moscow, Russia
G. L. Klimchitskaya: North-West Polytechnical Institute, Department of Physics, Millionnaya Str. 5, 191065, St. Petersburg, Russia;
V. M. Mostepanenko: St. Petersburg State Technological Institute, Department of Mathematics, Moskowsky pr. 26, 198013, St. Petersbury, Russia;
Surface Review and Letters (SRL), 1997, vol. 04, issue 04, 613-620
Abstract:
The scanning of the AFM tip above the surface of close-packed crystal is considered. The surface of constant force projection are calculated onto the arbitrary axis inclined at some angle to the vertical direction. It has been shown that the relief depth of such constant force surfaces is larger than for the generally used ones, for which the value of the vertical force component is constant. Both the case of perfect crystal and of crystal with point surface defects are investigated.
Date: 1997
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DOI: 10.1142/S0218625X97000602
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