SURFACE TRANSMISSION ELECTRON MICROSCOPY ON STRUCTURES WITH TRUNCATION

Kunio Takayanagi, Yoshitaka Naitoh, Yoshifumi Oshima and Masanori Mitome
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Kunio Takayanagi: Tokyo Institute of Technology, 4259 Midori-ku, Nagatsuta, Yokohama, 226, Japan
Yoshitaka Naitoh: Tokyo Institute of Technology, 4259 Midori-ku, Nagatsuta, Yokohama, 226, Japan
Yoshifumi Oshima: Tokyo Institute of Technology, 4259 Midori-ku, Nagatsuta, Yokohama, 226, Japan
Masanori Mitome: Tokyo Institute of Technology, 4259 Midori-ku, Nagatsuta, Yokohama, 226, Japan;

Surface Review and Letters (SRL), 1997, vol. 04, issue 04, 687-694

Abstract: Surface transmission electron microscopy (TEM) has been used to reveal surface steps and structures by bright and dark field imaging, and high resolution plan view and/or profile view imaging. Dynamic processes on surfaces, such as step motion, surface phase transitions and film growths, are visualized by a TV system attached to the electron microscope. Atom positions can precisely be detected by convergent beam illumination (CBI) of high resolution surface TEM. Imaging of the atomic positions of surfaces with truncation is briefly reviewed in this paper, with recent development of a TEM–STM (scanning tunneling microscope) system.

Date: 1997
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DOI: 10.1142/S0218625X97000687

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