LATEST PHOTOEMISSION DEVELOPMENTS: TIME RESOLUTION, MICROANALYSIS, ORDER PARAMETERS

G. Comelli, M. Kiskinova, G. Paolucci, K. C. Prince, A. Savoia and G. Margaritondo
Additional contact information
G. Comelli: Sincrotrone Trieste SCpA, Trieste, Italy;
M. Kiskinova: Sincrotrone Trieste SCpA, Trieste, Italy
G. Paolucci: Sincrotrone Trieste SCpA, Trieste, Italy;
K. C. Prince: Sincrotrone Trieste SCpA, Trieste, Italy
A. Savoia: Sincrotrone Trieste SCpA, Trieste, Italy
G. Margaritondo: Institut de Physique Appliquée, Ecole Polytechnique Fédérale, CH-1015 Lausanne, Switzerland;

Surface Review and Letters (SRL), 1997, vol. 04, issue 04, 695-701

Abstract: The third generation sources of soft X-rays, ALS and ELETTRA, have been producing data in surface and interface science for over two years. The impact of their ultrahigh brightness is quite evident, particularly as far as photoemission techniques are concerned. We illustrate this point with a short review of very recent examples from ELETTRA, in the specific domains of time resolution, high lateral resolution and high energy resolution.

Date: 1997
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DOI: 10.1142/S0218625X97000699

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