HOLOGRAPHY WITH KIKUCHI ELECTRONS: DIRECT IMAGING OF ORDERED TRIMERS ON${\rm A{\lc u}/S{\lc i}(111)}(\sqrt{3}\times \sqrt{3})$R30° AND${\rm S{\lc b}/S{\lc i}(111)}(\sqrt{3}\times \sqrt{3})$R30° INTERFACES

I. H. Hong, M. C. Jih, Y. C. Chou and C. M. Wei
Additional contact information
I. H. Hong: Research Division, Synchrotron Radiation Research Center, Hsinchu, Taiwan, R.O.C.
M. C. Jih: Department of Physics and Materials Science Research Center, Tsing Hua University, Hsinchu, Taiwan, R.O.C.
Y. C. Chou: Department of Physics and Materials Science Research Center, Tsing Hua University, Hsinchu, Taiwan, R.O.C.
C. M. Wei: Institute of Physics, Academia Sinica, Nankang, Taipei, Taiwan, R.O.C.

Surface Review and Letters (SRL), 1997, vol. 04, issue 04, 733-756

Abstract: The structural bases on the metal/semiconductor interfaces, such as gold trimers on the${\rm Au/Si(111)}(\sqrt{3}\times\sqrt{3})$R30° surface and antimony trimers on the${\rm Sb/Si(111)}(\sqrt{3}\times\sqrt{3})$R30° surface, can be imaged directly with a simple inversion of low-energy (>600 eV) Kikuchi-electron patterns (Kikuchi-electron holography—KEH). The relative positions of the building blocks (trimers) on the adsorbates to the substrate atoms are also determined. This short-range-order KEH tool, which provides the 3D Patterson function, can be viewed as a twin of grazing-incidence X-ray diffraction. Using direct structural information obtained by KEH, one can greatly reduce the tested models in a complete trial-and-error structural-determination process.

Date: 1997
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DOI: 10.1142/S0218625X97000730

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