THE IMPORTANCE OF STRAIN ANALYSIS IN STUDIES OF PSEUDOMORPHIC GROWTH

F. Jona and P. M. Marcus
Additional contact information
F. Jona: Department of Materials Science and Engineering, State University of New York, Stony Brook, New York 11794-2275, USA
P. M. Marcus: Department of Materials Science and Engineering, State University of New York, Stony Brook, New York 11794-2275, USA

Surface Review and Letters (SRL), 1997, vol. 04, issue 05, 817-820

Abstract: Since a pseudomorphic film is usually strained both in the plane of the surface and in the perpendicular direction, strain analysis is necessary in order to determine the strains and identify the equilibrium (i.e. the unstrained) phase of the film material. A procedure for carrying out the strain analysis within the limits of linear elasticity theory is described by way of a simple hypothetical example with cubic {001} surfaces, which illustrates the concept of epitaxial lines. These are lines relating the perpendicular spacing between atomic planes, as produced by epitaxial strain on a stable or metastable crystal phase, to the in-plane spacing in pseudomorphic films.

Date: 1997
References: Add references at CitEc
Citations:

Downloads: (external link)
http://www.worldscientific.com/doi/abs/10.1142/S0218625X97000821
Access to full text is restricted to subscribers

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:04:y:1997:i:05:n:s0218625x97000821

Ordering information: This journal article can be ordered from

DOI: 10.1142/S0218625X97000821

Access Statistics for this article

Surface Review and Letters (SRL) is currently edited by S Y Tong

More articles in Surface Review and Letters (SRL) from World Scientific Publishing Co. Pte. Ltd.
Bibliographic data for series maintained by Tai Tone Lim ().