ATOMIC RESOLUTION STM OF THENiO(001)SURFACE STRUCTURE AND DEFECT SITES: c(2×2)PATTERNING AND EFFECTS OF COVALENT BONDING

M. R. Castell, S. L. Dudarev, P. L. Wincott, N. G. Condon, C. Muggelberg, G. Thornton, D. Nguyen Manh, A. P. Sutton and G. A. D. Briggs
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M. R. Castell: Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK
S. L. Dudarev: Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK
P. L. Wincott: IRC in Surface Science and Chemistry Department, Manchester University, Manchester M13 9PL, UK
N. G. Condon: IRC in Surface Science, University of Liverpool, Liverpool L69 3BX, UK
C. Muggelberg: Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK
G. Thornton: IRC in Surface Science and Chemistry Department, Manchester University, Manchester M13 9PL, UK
D. Nguyen Manh: Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK
A. P. Sutton: Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK
G. A. D. Briggs: Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK

Surface Review and Letters (SRL), 1997, vol. 04, issue 05, 1003-1008

Abstract: Elevated temperature STM has been used to obtain atomic resolution images of flat regions, defect sites and step edges on the (001) surface of crystalline nickel oxide. Identification of surface lattice sites seen in empty and filled states (nickel and oxygen sites, respectively) is consistent with recent theoretical results according to which NiO is a charge transfer insulator with strongly correlated electrons. It has been found that certain surface defects lead to the formation ofspatially delocalizedhole states resulting in c(2×2) patterning in STM images. The appearance of this patterning points to the presence of a substantial covalent contribution to chemical bonding in NiO.

Keywords: 61.16.Ch; 61.50.Lt; 61.72.Ji; 68.35.Bs; 71.27.+a; 72.80.Ga (search for similar items in EconPapers)
Date: 1997
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DOI: 10.1142/S0218625X97001188

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