MEASUREMENTS OF SPECTRAL RESOLVED PHOTON INTENSITY MAP FOR METAL PARTICLES BY STM

R. Nishitani, T. Umeno, A. Kasuya and Y. Nishina
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R. Nishitani: Department of Computer Science and Electronics, Kyushu Institute of Technology, Iizuka, Fukuoka 820, Japan
T. Umeno: Department of Computer Science and Electronics, Kyushu Institute of Technology, Iizuka, Fukuoka 820, Japan
A. Kasuya: Institute for Materials Research, Tohoku University Katahira, Sendai 980-77, Japan
Y. Nishina: Institute for Materials Research, Tohoku University Katahira, Sendai 980-77, Japan

Surface Review and Letters (SRL), 1997, vol. 04, issue 05, 1009-1013

Abstract: We have measured for the first time the spectral resolved photon maps of the light induced by scanning tunneling microscopy (STM) of noble metal particles on the graphite surface. The photon intensity as a whole is linearly correlated with the height of the topography of the samples. The photon map changes depending on the wavelength of the light collected. The position-dependent contrast besides the height-dependent contrast is obtained by normalizing the photon map with the corresponding STM topography. The normalized photon maps show that the spectral modes of the light emitted are varied with the tip position on the particles. The result shows that the contrast of the photon map is dependent on both the sample topography and the tip shape. A measurement of an isochromat photon map is also made for the mixture of gold and silver metals for a chemical analysis.

Date: 1997
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DOI: 10.1142/S0218625X9700119X

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