A RAY TRACING METHOD TO DESCRIBE THE ANGULAR PROFILES OF DIFFRACTION RODS IN SURFACE X RAY EXPERIMENTS

X. Torrelles, J. Alvarez and S. Ferrer
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X. Torrelles: European Synchrotron Radiation Facility, BP 220, F-38043, Grenoble, France
J. Alvarez: European Synchrotron Radiation Facility, BP 220, F-38043, Grenoble, France
S. Ferrer: European Synchrotron Radiation Facility, BP 220, F-38043, Grenoble, France

Surface Review and Letters (SRL), 1997, vol. 04, issue 05, 1035-1038

Abstract: The accurate determination of the coordinates normal to the surface in X ray diffraction experiments requires measuring up to high exit angles. Under these conditions some instrumental and geometrical effects related to the dimensions of the detector slits and the location in the Ewald sphere of the outgoing beam may complicate the analysis of the data. We have developed a method based on the ray tracing technique to investigate the appropriate corrections. Examples for Ge(001)-(2×1) are presented.

Date: 1997
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DOI: 10.1142/S0218625X97001243

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