MEASUREMENT OF SURFACE STRESS: DESCRIPTION OF AN INTERFEROMETRIC METHOD

G. Degand, P. Müller and R. Kern
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G. Degand: Centre de Recherche sur les Mécanismes de la Croissance Cristalline, (Associé aux Universités Aix-Marseille II et III.) Campus de Luminy, case 913, F-13288 Marseille Cedex 9, France
P. Müller: Centre de Recherche sur les Mécanismes de la Croissance Cristalline, (Associé aux Universités Aix-Marseille II et III.) Campus de Luminy, case 913, F-13288 Marseille Cedex 9, France
R. Kern: Centre de Recherche sur les Mécanismes de la Croissance Cristalline, (Associé aux Universités Aix-Marseille II et III.) Campus de Luminy, case 913, F-13288 Marseille Cedex 9, France

Surface Review and Letters (SRL), 1997, vol. 04, issue 05, 1047-1050

Abstract: In a recent publication, we proposed a new experimental method for measuring the absolute surface stress of a thin crystalline sheet based on the deformation of very thin sheets (thicknesse

Date: 1997
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DOI: 10.1142/S0218625X97001279

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