COMBINED HRLEED AND STM INVESTIGATIONS ON THE INITIAL STAGES OFCuHETEROEPITAXYRu(0001)

Ch. Ammer (), K. Meinel, H. Wolter, A. Beckmann and H. Neddermeyer
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Ch. Ammer: Martin-Luther-Universität Halle-Wittenberg, Fachbereich Physik, D-06099 Halle, Germany
K. Meinel: Martin-Luther-Universität Halle-Wittenberg, Fachbereich Physik, D-06099 Halle, Germany
H. Wolter: Martin-Luther-Universität Halle-Wittenberg, Fachbereich Physik, D-06099 Halle, Germany
A. Beckmann: Martin-Luther-Universität Halle-Wittenberg, Fachbereich Physik, D-06099 Halle, Germany
H. Neddermeyer: Martin-Luther-Universität Halle-Wittenberg, Fachbereich Physik, D-06099 Halle, Germany

Surface Review and Letters (SRL), 1997, vol. 04, issue 06, 1167-1171

Abstract: Recent scanning tunneling microscopy (STM) observations revealed different layer structures in the heteroepitaxial Cu/Ru(0001) system with increasing film thickness attributed to various stages of strain relaxation. High-resolution low-energy electron diffraction (HRLEED) analysis permits one to derive more exactly both lattice periodicities and lattice rotations. Furthermore, the representative character of local STM results can be proved. However, STM measurements are needed to identify and to assign the satellite spots to coexistent different superstructures which are superposed incoherently in the diffraction pattern. Generally, the integral LEED results confirm the crystallographic data obtained by STM in a local scale.

Date: 1997
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DOI: 10.1142/S0218625X97001486

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