THE GROWTH AND ATOMIC STRUCTURE OF THALLIUM ON COPPER(001)

C. L. Nicklin, C. Norris, C. Binns, N. Jones, J. Alvarez and X. Torrelles
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C. L. Nicklin: Department of Physics and Astronomy, University of Leicester, Leicester, LE1 7RH, UK
C. Norris: Department of Physics and Astronomy, University of Leicester, Leicester, LE1 7RH, UK
C. Binns: Department of Physics and Astronomy, University of Leicester, Leicester, LE1 7RH, UK
N. Jones: Department of Physics and Astronomy, University of Leicester, Leicester, LE1 7RH, UK
J. Alvarez: European Synchrotron Radiation Facility, Grenoble, France
X. Torrelles: European Synchrotron Radiation Facility, Grenoble, France

Surface Review and Letters (SRL), 1997, vol. 04, issue 06, 1191-1196

Abstract: We report a determination of the room temperature growth and atomic structure of ultrathin films of thallium on copper(001) using surface X-ray diffraction. The results show clearly that the growth is layerwise up to two monolayers and islanded thereafter. This is contrary to earlier reports which suggested that the islanding commenced at one monolayer. The first submonolayer structure to appear is a c(4×4) arrangement. Reflectivity scans suggest that there is significant reordering of the substrate at this coverage.

Date: 1997
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DOI: 10.1142/S0218625X97001528

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