A SEXAFS STUDY OF ULTRATHINCrFILMS

J. C. Cook, M. Dowling, W. Schwarzacher and E. M. McCASH
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J. C. Cook: Department of Chemistry, University of York, Heslington, York, YO1 5DD, UK;
M. Dowling: Department of Physics, HH Wills Laboratory, University of Bristol, Bristol BS5 1TH, UK
W. Schwarzacher: Department of Physics, HH Wills Laboratory, University of Bristol, Bristol BS5 1TH, UK
E. M. McCASH: Department of Chemistry, University of York, Heslington, York, YO1 5DD, UK

Surface Review and Letters (SRL), 1997, vol. 04, issue 06, 1257-1261

Abstract: Three types ofCrfilms were grown on Pd(100) at different substrate temperatures. The film thickness was found to be the crucial parameter in determining the film structure; substrate temperature was found to make little difference to the surface EXAFS pattern observed. Films with a thickness greater than 6 monolayers (ML) of Cr were body-centered-cubic (bcc); those with a thickness less than 3 ML Cr appear to be face-centered-cubic (fcc) and those in between were initially bcc but after annealing to ~500 K produced an fcc-like SEXAFS pattern. The SEXAFS of both thin and medium films can be interpreted in terms of a Cr–Pd alloy on the surface.

Date: 1997
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DOI: 10.1142/S0218625X97001632

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