Electronic Structure of the Ultrathin Cs/Si(100)-(2 × 1) and Cs/Si(111)-(7 × 7) Interfaces in the Threshold Energy Region

G. V. Benemanskaya, D. V. Daineka and G. E. Frank-Kamenetskaya
Additional contact information
G. V. Benemanskaya: A. F. Ioffe Physical-Technical Institute of Russian Academy of Sciences, St. Petersburg, Russia
D. V. Daineka: A. F. Ioffe Physical-Technical Institute of Russian Academy of Sciences, St. Petersburg, Russia
G. E. Frank-Kamenetskaya: Technological Institute, St. Petersburg, Russia

Surface Review and Letters (SRL), 1998, vol. 05, issue 01, 91-95

Abstract: The electronic band structure of the Cs/Si(100)-(2 × 1) and Cs/Si(111)-(7 ×7) interfaces has been studied near the Fermi level at submonolayer coverages. The technique of threshold photoemission spectroscopy with linearly polarized light excitation has been employed. Surface photoemission spectra reveal on Cs-induced band which can be either below the VBM or at the Fermi level, depending on the substrate. Parameters of the Cs band and the change in ionization energy and work function are obtained as a function of Cs coverage. Experimental data provide direct evidence that the Cs/Si(100)-(2 × 1) interface exhibits semiconducting charcter in a great part of the submonolayer range, in contrast to the metallic-like Cs/Si(111)-(7 × 7) interface.

Date: 1998
References: Add references at CitEc
Citations:

Downloads: (external link)
http://www.worldscientific.com/doi/abs/10.1142/S0218625X98000190
Access to full text is restricted to subscribers

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:05:y:1998:i:01:n:s0218625x98000190

Ordering information: This journal article can be ordered from

DOI: 10.1142/S0218625X98000190

Access Statistics for this article

Surface Review and Letters (SRL) is currently edited by S Y Tong

More articles in Surface Review and Letters (SRL) from World Scientific Publishing Co. Pte. Ltd.
Bibliographic data for series maintained by Tai Tone Lim ().