Structure of Epitaxial CoSi2Films on Si(111) Studied with Low-Energy Electron Diffraction (LEED)

U. Starke, J. Schardt, W. Weiß, G. Rangelov, Th. Fauster and K. Heinz
Additional contact information
U. Starke: Lehrstuhl; für Festkörperphysik, Universität Erlangen-Nürnberg, Staudtstr. 7, D-91058 Erlangen, Germany
J. Schardt: Lehrstuhl; für Festkörperphysik, Universität Erlangen-Nürnberg, Staudtstr. 7, D-91058 Erlangen, Germany
W. Weiß: Lehrstuhl; für Festkörperphysik, Universität Erlangen-Nürnberg, Staudtstr. 7, D-91058 Erlangen, Germany
G. Rangelov: Max-Planck-Institut für Plasmaphysik, Boltzmannstr. 2, D-85748 Garching, Germany
Th. Fauster: Lehrstuhl; für Festkörperphysik, Universität Erlangen-Nürnberg, Staudtstr. 7, D-91058 Erlangen, Germany;
K. Heinz: Lehrstuhl; für Festkörperphysik, Universität Erlangen-Nürnberg, Staudtstr. 7, D-91058 Erlangen, Germany

Surface Review and Letters (SRL), 1998, vol. 05, issue 01, 139-144

Abstract: Expitaxial films ofCoSi2on Si(111) were investigated by low-energy electron diffraction. Films of approximately 12 Å thickness were prepared by simultaneous deposition of Co and Si and subsequent annealing. The films were found to crystallize inCaF2structure in (111) orientation. Two (1×1) phases of different stoichiometry exist. The surface phase that contains more Co is found to be aCoSi2(111)bulklike structure terminated by a Si–Co–Si trilayer. The Si-rich phase is terminated by an additional nonrotated silicon bilayer with the lower silicon atoms bound to cobalt in the firstCoSi2layer. Consequently, these cobalt atoms have an eightfold coordination. Due to the lattice mismatch the silicide films are expanded by 0.5% in the lateral direction and contracted by 1.4% in the vertical direction.

Date: 1998
References: Add references at CitEc
Citations:

Downloads: (external link)
http://www.worldscientific.com/doi/abs/10.1142/S0218625X9800027X
Access to full text is restricted to subscribers

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:05:y:1998:i:01:n:s0218625x9800027x

Ordering information: This journal article can be ordered from

DOI: 10.1142/S0218625X9800027X

Access Statistics for this article

Surface Review and Letters (SRL) is currently edited by S Y Tong

More articles in Surface Review and Letters (SRL) from World Scientific Publishing Co. Pte. Ltd.
Bibliographic data for series maintained by Tai Tone Lim ().