Composition and Structure of β-SiC(100)-(2 × 2) Surfaces Monitored by Photoemission Spectroscopy using Synchrotron Radiation

L. Douillard, F. Semond, P. Soukiassian, D. Dunham, F. Amy, S. Rivillon and Z. Hurych
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L. Douillard: Commissariat à l'Energie Atomique, DSM-DRECAM-SRSIM, Bâtiment 462, Centre d'Etudes de Saclay, 91191 and Gif sur Yvette Cedex, France;
F. Semond: Commissariat à l'Energie Atomique, DSM-DRECAM-SRSIM, Bâtiment 462, Centre d'Etudes de Saclay, 91191 and Gif sur Yvette Cedex, France;
P. Soukiassian: Commissariat à l'Energie Atomique, DSM-DRECAM-SRSIM, Bâtiment 462, Centre d'Etudes de Saclay, 91191 and Gif sur Yvette Cedex, France;
D. Dunham: Department of Physics, Northern Illinois University, DeKalb, Illinois 60115-2854, USA
F. Amy: Department of Physics, Northern Illinois University, DeKalb, Illinois 60115-2854, USA
S. Rivillon: Department of Physics, Northern Illinois University, DeKalb, Illinois 60115-2854, USA
Z. Hurych: Department of Physics, Northern Illinois University, DeKalb, Illinois 60115-2854, USA

Surface Review and Letters (SRL), 1998, vol. 05, issue 01, 213-217

Abstract: We investigate the single domain β-SiC(100)-(2 × 1) surface reconstruction by core level and valence band photoemission spectroscopies using synchrotron radiation. Specific spectral features at the Si 2p and C 1s core levels including bulk and surface core level shifts, and in the valence band, bring experimental evidence of reproducible β-SiC(100)-(2 × 1) structures having different Si/C compositions ranging from Si-terminated to Si- + C-containing surfaces.

Date: 1998
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DOI: 10.1142/S0218625X98000396

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