Growth of Cobalt on GaAs(001) Studied by Photoemission and Photoelectron Diffraction

S. Ababou, B. Lépine, R. Pingel, A. Godefroy, A. Quémerais, A. Guivarch and G. Jézéquel
Additional contact information
S. Ababou: Laboratoire de Spectroscopie du Solide, ERS CNRS 0136, Bât. 11C, Campus de Beaulieu, F-35042 Rennes Cédex, France
B. Lépine: Laboratoire de Spectroscopie du Solide, ERS CNRS 0136, Bât. 11C, Campus de Beaulieu, F-35042 Rennes Cédex, France
R. Pingel: Laboratoire de Spectroscopie du Solide, ERS CNRS 0136, Bât. 11C, Campus de Beaulieu, F-35042 Rennes Cédex, France
A. Godefroy: Laboratoire de Spectroscopie du Solide, ERS CNRS 0136, Bât. 11C, Campus de Beaulieu, F-35042 Rennes Cédex, France
A. Quémerais: Laboratoire de Spectroscopie du Solide, ERS CNRS 0136, Bât. 11C, Campus de Beaulieu, F-35042 Rennes Cédex, France
A. Guivarch: Laboratoire de Spectroscopie du Solide, ERS CNRS 0136, Bât. 11C, Campus de Beaulieu, F-35042 Rennes Cédex, France
G. Jézéquel: Laboratoire de Spectroscopie du Solide, ERS CNRS 0136, Bât. 11C, Campus de Beaulieu, F-35042 Rennes Cédex, France

Surface Review and Letters (SRL), 1998, vol. 05, issue 01, 285-288

Abstract: Co ultrathin films of increasing thickness (1–40 ML) are deposited on MBE grown GaAs(001) (As2×4) substrates at RT and 200°C and studied by integrated photoemission and photoelectron diffraction. Co appears to grow on a reocted layer whose thickness strongly depends on deposition temperature (up to 4 nm at 200°C). This interfacial reacted layer appears to exhibit a layered structure composed of two compounds.

Date: 1998
References: Add references at CitEc
Citations:

Downloads: (external link)
http://www.worldscientific.com/doi/abs/10.1142/S0218625X98000529
Access to full text is restricted to subscribers

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:05:y:1998:i:01:n:s0218625x98000529

Ordering information: This journal article can be ordered from

DOI: 10.1142/S0218625X98000529

Access Statistics for this article

Surface Review and Letters (SRL) is currently edited by S Y Tong

More articles in Surface Review and Letters (SRL) from World Scientific Publishing Co. Pte. Ltd.
Bibliographic data for series maintained by Tai Tone Lim ().