Variation of the Local Work Function of MgO(001) Surface by Palladium Deposition

J.-P. Di Salvo and E. Gillet
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J.-P. Di Salvo: SERMEC, Case 261, Faculté des Sciences et Techiques de St-Jérôme, F-13397 Marseille Cedex 20, France
E. Gillet: SERMEC, Case 261, Faculté des Sciences et Techiques de St-Jérôme, F-13397 Marseille Cedex 20, France

Surface Review and Letters (SRL), 1998, vol. 05, issue 01, 363-367

Abstract: A study of ultrathin palladium films deposited on MgO(100) is reported. The early studies of the growth arein situinvestigated at 300 K and 600 K by secondary ion mass spectrometry used in static mode (SSIMS). The variation of ion species typical of the metal deposit (Pd+,$\rm{Pd}^+_2$) and of the substrate (MgO+) is analyzed as a function of the deposit mean thickness. The results show that Pd films grow initially by sticking of isolated adatoms on sites leading to the formation of 2D islands until a critical coverage which depends on the temperature. Thereafter a second layer begins to grow that leads to 3D flat clusters at high temperatures. The SSIMS method enables us to determine quantitatively the local work function of both palladium and MgO surfaces. Changes in the electronic structure of these systems during deposition of the two first Pd layers suggest a strong influence of the oxide support.

Date: 1998
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DOI: 10.1142/S0218625X98000670

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