Comparison of Cu-MgO Interfaces Studied by EXES and XPS

P. Jonnard, C. Hombourger, F. Vergand, C. Bonnelle, B. Ealet, A. Renou and E. Gillet
Additional contact information
P. Jonnard: Laboratoire de Chimie Physique, Matière et Rayonnement de l'Université Pierre et Marie Curie, URA 176, 11 rue Pierre et Marie Curie, 75231 Paris cedex 05, France
C. Hombourger: Laboratoire de Chimie Physique, Matière et Rayonnement de l'Université Pierre et Marie Curie, URA 176, 11 rue Pierre et Marie Curie, 75231 Paris cedex 05, France
F. Vergand: Laboratoire de Chimie Physique, Matière et Rayonnement de l'Université Pierre et Marie Curie, URA 176, 11 rue Pierre et Marie Curie, 75231 Paris cedex 05, France
C. Bonnelle: Laboratoire de Chimie Physique, Matière et Rayonnement de l'Université Pierre et Marie Curie, URA 176, 11 rue Pierre et Marie Curie, 75231 Paris cedex 05, France
B. Ealet: Laboratoire Structure et Réactivité des Systèmes Métal-Céramique, case 261, Faculté Saint Jérême, 13397 Marseille cedex 20, France
A. Renou: Laboratoire Structure et Réactivité des Systèmes Métal-Céramique, case 261, Faculté Saint Jérême, 13397 Marseille cedex 20, France
E. Gillet: Laboratoire Structure et Réactivité des Systèmes Métal-Céramique, case 261, Faculté Saint Jérême, 13397 Marseille cedex 20, France

Surface Review and Letters (SRL), 1998, vol. 05, issue 01, 369-373

Abstract: With the aim of studying the physicochemical interactions in metal-ceramic interfaces, we have investigated the Cu-MgO system. Two kinds of interfaces prepared at room temperature have been studied: interfaces during their formation (studied by X-ray photoelectron and Auger spectroscopies — XPS, AES) and buried interfaces (studied by electron-induced X-ray emission spectroscopy — EXES). Auger parameter results reveal a Cu(I) state for copper and point out, by comparison with the Cu-NaCl interface, that the oxidation comes from an interaction at the interface. EXES studies of the oxygen and copper valence densities of states evidence that the same kind of interaction exists at the interface between thick films of Cu and MgO and it does not exceed one interatomic distance.

Date: 1998
References: Add references at CitEc
Citations:

Downloads: (external link)
http://www.worldscientific.com/doi/abs/10.1142/S0218625X98000682
Access to full text is restricted to subscribers

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:05:y:1998:i:01:n:s0218625x98000682

Ordering information: This journal article can be ordered from

DOI: 10.1142/S0218625X98000682

Access Statistics for this article

Surface Review and Letters (SRL) is currently edited by S Y Tong

More articles in Surface Review and Letters (SRL) from World Scientific Publishing Co. Pte. Ltd.
Bibliographic data for series maintained by Tai Tone Lim ().