The Feasibility of Determining Vacancy Migration Energy by Atomic Force Microscopy Data

E. V. Blagov, G. L. Klimchitskaya and V. M. Mostepanenko ()
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E. V. Blagov: Research and Innovation Enterprise "Modus," Zagorodnoye shosse 8/7, Box 49, Moscow, 113152, Russia
G. L. Klimchitskaya: North-West Polytechnical Institute, Department of Physics, Millionnaya str. 5, 191065, St. Petersburg, Russia
V. M. Mostepanenko: Research and Innovation Enterprise "Modus," Zagorodnoye shosse 8/7, Box 49, Moscow, 113152, Russia

Surface Review and Letters (SRL), 1998, vol. 05, issue 02, 559-567

Abstract: A computation is performed of the constant force lines and profiles of the lateral force component when scanning the atomic force microscope tip in contact mode above a close-packed surface, containing a vacancy type defect with allowance for the displacements of the surface atoms. Three different scanning regimes are investigated which may exist for the different values of the scanning force: without modification of the surface, with a single jump of the defect in opposition to the scanning direction, and with a "dragging" of a vacancy behind a tip. It is shown that by the lines of constant force one may conclude what regime is actually realized, and that by the profiles of the lateral force component one may estimate quantitatively the value of the vacancy migration energy.

Date: 1998
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DOI: 10.1142/S0218625X98000943

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