Surface Electrical Conduction Correlated with Surface Structures and Atom Dynamics

Shuji Hasegawa (), Chun-Sheng Jiang, Yuji Nakajima, Tadaaki Nagao and Xiao Tong
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Shuji Hasegawa: Department of Physics, School of Science, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan
Chun-Sheng Jiang: Department of Physics, School of Science, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan
Yuji Nakajima: Department of Physics, School of Science, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan
Tadaaki Nagao: Department of Physics, School of Science, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan
Xiao Tong: Core Research for Evolutional Science and Technology (CREST), Japan Science and Technology Corporation (JST), Japan

Surface Review and Letters (SRL), 1998, vol. 05, issue 03n04, 803-819

Abstract: By utilizing a variety of surface super structures formed on silicon surfaces, we have clarified close correlations between the atomic-scale structures and surface-electrical-conduction phenomena. In paricular, we have succeeded for the first time in experimentally confirming the electrical conduction via surface-state bands that are inherent in the surface supertructures. Also, an important phenomenon has been found: atoms adsorbed on the surface donate carriers to the surface-state band, resulting in a remarkable enhancement of conductivity. The ultimate two-dimensional electron systems composed of surface-state bands, which are made close up in our study, are expected to provide a new stage insurface physics.

Keywords: 73.25.+i; 73.20.At; 68.35.-p (search for similar items in EconPapers)
Date: 1998
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DOI: 10.1142/S0218625X98001183

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