Atomic Paths in Scanning of the AFM Tip above the Close-Packed Surface in Repulsive Mode

E. V. Blagov, G. L. Klimchitskaya and V. M. Mostepanenko ()
Additional contact information
E. V. Blagov: Research and Innovation Enterprise "Modus," Zagorodnoye shosse 8/7, Box 49, Moscow, 113152, Russia
G. L. Klimchitskaya: North-West Polytechnical Institute, Department of Physics, Millionnaya str. 5, St. Petersburg, 191065, Russia
V. M. Mostepanenko: Research and Innovation Enterprise "Modus," Zagorodnoye shosse 8/7, Box 49, Moscow, 113152, Russia

Surface Review and Letters (SRL), 1998, vol. 05, issue 05, 989-996

Abstract: The paths are calculated for the surface and tip apex atoms when scanning the AFM tip above the close-packed lattice in contact mode. The interaction of the sample and the tip atoms is considered in elastic approximation. The dependence of the atomic paths on the type of the tip and its orientation is investigated. It is shown that the vertical characteristic sizes of the atomic paths are several times larger than the vertical resolution of the atomic force microscope.

Date: 1998
References: Add references at CitEc
Citations:

Downloads: (external link)
http://www.worldscientific.com/doi/abs/10.1142/S0218625X98001341
Access to full text is restricted to subscribers

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:05:y:1998:i:05:n:s0218625x98001341

Ordering information: This journal article can be ordered from

DOI: 10.1142/S0218625X98001341

Access Statistics for this article

Surface Review and Letters (SRL) is currently edited by S Y Tong

More articles in Surface Review and Letters (SRL) from World Scientific Publishing Co. Pte. Ltd.
Bibliographic data for series maintained by Tai Tone Lim ().