LEEM Basics
Ernst Bauer
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Ernst Bauer: Department of Physics and Astronomy, Arizona State University, Tempe, AZ 85287-1504, USA
Surface Review and Letters (SRL), 1998, vol. 05, issue 06, 1275-1286
Abstract:
The fundamental physical phenomena on which LEEM is based are discussed, with the goal of showing why LEEM works, not how it works. The subjects covered include intensity, resolution, contrast, sampling depth and combination possibilities with other techniques (particularly LEED) which make LEEM a unique surface imaging method.
Date: 1998
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Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:05:y:1998:i:06:n:s0218625x98001614
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DOI: 10.1142/S0218625X98001614
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