SPELEEM: Combining LEEM and Spectroscopic Imaging

Th. Schmidt, S. Heun, J. Slezak, J. Diaz, K. C. Prince, G. Lilienkamp and E. Bauer
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Th. Schmidt: ELETTRA, Sincrotrone Trieste, 34012 Basovizza-Trieste, Italy
S. Heun: ELETTRA, Sincrotrone Trieste, 34012 Basovizza-Trieste, Italy
J. Slezak: ELETTRA, Sincrotrone Trieste, 34012 Basovizza-Trieste, Italy
J. Diaz: ELETTRA, Sincrotrone Trieste, 34012 Basovizza-Trieste, Italy
K. C. Prince: ELETTRA, Sincrotrone Trieste, 34012 Basovizza-Trieste, Italy
G. Lilienkamp: Physikalisches Institut, Technische Universität Clausthal, 38678 Clausthal-Zellerfeld, Germany
E. Bauer: Department of Physics and Astronomy, Arizona State University, Tempe, AZ 85287-1504, USA

Surface Review and Letters (SRL), 1998, vol. 05, issue 06, 1287-1296

Abstract: At present the only surface electron microscope which allows true characteristic XPEEM (photoemission electron microscopy using synchrotron radiation) and structural characterization is the spectroscopic LEEM developed at the Technical University Clausthal in the early nineties. This instrument has in the past been used mainly for LEEM studies of various surface and thin film phenomena, because it had very limited access to synchrotron radiation. Now the microscope is connected quasipermanently to the undulator beamline 6.2 at the storage ring ELETTRA, operating successfully since the end of 1996 under the name SPELEEM (Spectroscopic PhotoEmission and Low Energy Electron Microscope). The high brightness of the ELETTRA light source, together with an optimized instrument, results in a spatial resolution better than 25 nm and an energy resolution better than 0.5 eV in the XPEEM mode. The instrument can be used alternately for XPEEM, LEEM, LEED (low energy electron diffraction), MEM (mirror electron microscopy) and other imaging modes, depending upon the particular problem studied. The combination of these imaging modes allows a comprehensive characterization of the specimen. This is of particular importance when the chemical identification of structurar features is necessary for the understanding of a surface or thin film process. In addition, PED (photoelectron diffraction) and VPEAD (valence photoelectron angular distribution) of small selected areas give local atomic configuration and band structure information, respectively.

Date: 1998
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DOI: 10.1142/S0218625X98001626

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