SYNCHROTRON RADIATION SCANNING PHOTOEMISSION MICROSCOPY: INSTRUMENTATION AND APPLICATION IN SURFACE SCIENCE

M. Kiskinova, M. Marsi, E. Di Fabrizio and M. Gentili
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M. Kiskinova: Sincrotrone Trieste, Area Science Park, 34012 Basovizza, Trieste, Italy
M. Marsi: Sincrotrone Trieste, Area Science Park, 34012 Basovizza, Trieste, Italy
E. Di Fabrizio: IESS, CNR, via C. Romano 42, 00156 Rome, Italy
M. Gentili: IESS, CNR, via C. Romano 42, 00156 Rome, Italy

Surface Review and Letters (SRL), 1999, vol. 06, issue 02, 265-286

Abstract: X-ray photoelectron spectroscopy has become a true microscopic technique at third generation soft X-ray synchrotron sources, finding applications in many domains of academic and applied research. This paper describes the present status of scanning photoemission microscopy, where by using photon optics the photon beam can be focused to micron or submicron dimensions and imaging or spectroscopy can be performed. It discusses different photon focusing optical elements and describes the major components of the constructed scanning microscopes. The applications of imaging and spectroscopy with high lateral resolution in surface science are illustrated, and some recent results obtained in different laboratories are briefly reviewed.

Date: 1999
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DOI: 10.1142/S0218625X99000287

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