STRUCTURE OFAg{410}

F. Jona, P. M. Marcus, E. Zanazzi and M. Maglietta
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F. Jona: Department of Materials Science and Engineering, State University of New York, Stony Brook, NY 11794-2275, USA
P. M. Marcus: Department of Materials Science and Engineering, State University of New York, Stony Brook, NY 11794-2275, USA
E. Zanazzi: Dipartimento di Chimica, Università di Firenze, Via G. Capponi 9, 50121 Firenze, Italy
M. Maglietta: Dipartimento di Chimica, Università di Firenze, Via G. Capponi 9, 50121 Firenze, Italy

Surface Review and Letters (SRL), 1999, vol. 06, issue 03n04, 355-359

Abstract: A quantitative low-energy electron diffraction (QLEED) analysis of data collected from a clean Ag{410} surface finds no relaxation of the first interlayer spacing, 36% compression of the second interlayer spacing and 18% expansion of the third interlayer spacing with respect to the bulk value (0.496 Å). The Ag{410} surface is a stepped surface with the smallest interlayer spacing analyzed so far by QLEED with the computer program CHANGE. Some difficulties in the analysis are discussed.

Date: 1999
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DOI: 10.1142/S0218625X99000354

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