DIFFERENTIAL-REFLECTANCE SPECTROSCOPY AND REFLECTANCE-ANISOTROPY SPECTROSCOPY ON SEMICONDUCTOR SURFACES

P. Chiaradia and R. Del Sole
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P. Chiaradia: Dipartimento di Fisica and INFM, Università di Roma Tor Vergata, Roma, Italy
R. Del Sole: Dipartimento di Fisica and INFM, Università di Roma Tor Vergata, Roma, Italy

Surface Review and Letters (SRL), 1999, vol. 06, issue 03n04, 517-528

Abstract: The development and the state of the art of surface methods based on the reflection of light are briefly reviewed. A short account is given of the main experimental and theoretical results obtained on semiconductor surfaces over about three decades.

Date: 1999
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DOI: 10.1142/S0218625X99000482

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