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ELECTRON MOMENTUM SPECTROSCOPY OF SURFACES

S. Tixier (), Y. Zheng, T. Tiedje, G. Cooper and C. E. Brion
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S. Tixier: AMPEL, Department of Physics and Astronomy, University of British Columbia, Vancouver, B.C. V6T 1Z1, Canada;
Y. Zheng: Department of Chemistry, University of British Columbia, Vancouver, B.C. V6T 1Z1, Canada
T. Tiedje: AMPEL, Department of Physics and Astronomy, University of British Columbia, Vancouver, B.C. V6T 1Z1, Canada;
G. Cooper: Department of Chemistry, University of British Columbia, Vancouver, B.C. V6T 1Z1, Canada
C. E. Brion: Department of Chemistry, University of British Columbia, Vancouver, B.C. V6T 1Z1, Canada

Surface Review and Letters (SRL), 1999, vol. 06, issue 05, 579-584

Abstract: Electron momentum spectroscopy [binary (e,2e) spectroscopy] using transmission geometry is a unique experimental tool for imaging the electron momentum distribution in gas phase samples as well as in thin films. In a solid, the electron momentum distribution is related to the band structure. Development of the (e,2e) technique using a more versatile reflection geometry is attractive since a much wider range of surfaces could be studied. The design of a new reflection (e,2e) spectrometer is presented. It is based on a two-step scattering model in which an incident electron successively reflects and ejects a valence electron from the surface. The scattered and ejected electrons are detected in coincidence and their energies and momentum vectors are simultaneously determined using a high throughput 90° truncated spherical electrostatic analyzer and position-sensitive detectors.

Date: 1999
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DOI: 10.1142/S0218625X99000524

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