MEASUREMENTS OF AUGER ELECTRON DIFFRACTION USING A 180° DEFLECTION TOROIDAL ANALYZER

Susumu Shiraki (), Hideshi Ishii, Yoshimasa Nihei and Masanori Owari
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Susumu Shiraki: Institute of Industrial Science, University of Tokyo, 7-22-1 Roppongi, Minato-ku, Tokyo 106-8558, Japan
Hideshi Ishii: Institute of Industrial Science, University of Tokyo, 7-22-1 Roppongi, Minato-ku, Tokyo 106-8558, Japan
Yoshimasa Nihei: Institute of Industrial Science, University of Tokyo, 7-22-1 Roppongi, Minato-ku, Tokyo 106-8558, Japan
Masanori Owari: Environmental Science Center, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan

Surface Review and Letters (SRL), 1999, vol. 06, issue 05, 585-590

Abstract: A 180° deflection toroidal analyzer is a novel electron spectrometer, which allows the simultaneous registration of the wide range of polar angles in a given azimuth of the sample. Therefore, measurements of photo- and Auger electron intensities over π steradians can be performed rapidly by azimuthal rotation of the sample. Using this analyzer, two-dimensional patterns of electron-beam-excited O KVV and Mg KVV Auger electron diffraction (AED) from a MgO(001) surface were measured in short acquisition times. The AED patterns obtained were compared with theoretical ones calculated by the multiple-scattering scheme. The agreement between experimental and theoretical data was good for both O KVV and Mg KVV transitions.

Date: 1999
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DOI: 10.1142/S0218625X99000536

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