RESONANT MAGNETIC SCATTERING OF POLARIZED SOFT X-RAYS

Maurizio Sacchi
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Maurizio Sacchi: Laboratoire pour l'Utilisation du Rayonnement Electromagnétique, BP 34, Centre Universitaire Paris-Sud, 91898 Orsay, France

Surface Review and Letters (SRL), 2000, vol. 07, issue 01n02, 175-189

Abstract: Resonant elastic scattering of polarized X-rays is a powerful technique for the study of the magnetic properties of solids. Its recent extension to the soft X-ray energy range has been driven by applications in the field of artificially structured magnetic devices, like multilayers and superlattices. This article reviews recent elastic scattering experiments using synchrotron radiation, performed at the 2p core resonances of transition metals in solids, thin films and ordered multilayers.

Date: 2000
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DOI: 10.1142/S0218625X00000233

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