ELECTRON ENERGY LOSS SPECTROSCOPY AND ANNULAR DARK FIELD IMAGING AT A NANOMETER RESOLUTION IN A SCANNING TRANSMISSION ELECTRON MICROSCOPE

O. Stéphan, A. Gloter, D. Imhoff, M. Kociak, C. Mory, K. Suenaga, M. Tencé and C. Colliex
Additional contact information
O. Stéphan: Laboratoire de Physique des Solides, Bâtiment 510, Université Paris-Sud, 91405 Orsay, France
A. Gloter: Laboratoire de Physique des Solides, Bâtiment 510, Université Paris-Sud, 91405 Orsay, France
D. Imhoff: Laboratoire de Physique des Solides, Bâtiment 510, Université Paris-Sud, 91405 Orsay, France
M. Kociak: Laboratoire de Physique des Solides, Bâtiment 510, Université Paris-Sud, 91405 Orsay, France
C. Mory: Laboratoire de Physique des Solides, Bâtiment 510, Université Paris-Sud, 91405 Orsay, France
K. Suenaga: Laboratoire de Physique des Solides, Bâtiment 510, Université Paris-Sud, 91405 Orsay, France
M. Tencé: Laboratoire de Physique des Solides, Bâtiment 510, Université Paris-Sud, 91405 Orsay, France
C. Colliex: Laboratoire de Physique des Solides, Bâtiment 510, Université Paris-Sud, 91405 Orsay, France

Surface Review and Letters (SRL), 2000, vol. 07, issue 04, 475-494

Abstract: The basics of electron energy loss spectroscopy (EELS) performed in the context of a scanning transmission electron microscope are described. This includes instrumentation, information contained in an EELS spectrum, data acquisition and processing, and some illustrations by a few examples.

Date: 2000
References: Add references at CitEc
Citations:

Downloads: (external link)
http://www.worldscientific.com/doi/abs/10.1142/S0218625X00000427
Access to full text is restricted to subscribers

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:07:y:2000:i:04:n:s0218625x00000427

Ordering information: This journal article can be ordered from

DOI: 10.1142/S0218625X00000427

Access Statistics for this article

Surface Review and Letters (SRL) is currently edited by S Y Tong

More articles in Surface Review and Letters (SRL) from World Scientific Publishing Co. Pte. Ltd.
Bibliographic data for series maintained by Tai Tone Lim ().