SCANNING PROBE MICROSCOPY APPLIED TO MATERIALS SCIENCE AND BIOLOGY

Paolo Perfetti, A. Cricenti and R. Generosi
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Paolo Perfetti: Istituto di Struttura della Materia del CNR, Via del Fosso del Cavaliere 130, Rome, Italy
A. Cricenti: Istituto di Struttura della Materia del CNR, Via del Fosso del Cavaliere 130, Rome, Italy
R. Generosi: Istituto di Struttura della Materia del CNR, Via del Fosso del Cavaliere 130, Rome, Italy

Surface Review and Letters (SRL), 2000, vol. 07, issue 04, 411-422

Abstract: A brief description of the scanning probe microscopies is given, with particular attention to atomic force microscopy (AFM) and near field optical microscopy (SNOM). We show examples of AFM used in friction mode and in topographic mode. The basic principles of SNOM are also presented, together with images obtained on artificial diamond films and on neuron networks.

Date: 2000
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DOI: 10.1142/S0218625X0000049X

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