TWO-DIMENSIONAL CIRCULARLY-POLARIZED-LIGHT PHOTOELECTRON DIFFRACTION FOR THE ANALYSIS OF MAGNETIC AND ELECTRONIC PROPERTIES ON SURFACES

K. Enomoto, Y. Miyatake, K. Fukumoto, A. Kobayashi, K. Hattori, H. Daimon (), M. Kotsugi, S. Suga, T. Nakatani and T. Matsushita
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K. Enomoto: Graduate School of Materials Science, Nara Institute of Science and Technology (NAIST), Ikoma, Nara 630-0101, Japan
Y. Miyatake: Graduate School of Materials Science, Nara Institute of Science and Technology (NAIST), Ikoma, Nara 630-0101, Japan
K. Fukumoto: Graduate School of Materials Science, Nara Institute of Science and Technology (NAIST), Ikoma, Nara 630-0101, Japan
A. Kobayashi: Graduate School of Materials Science, Nara Institute of Science and Technology (NAIST), Ikoma, Nara 630-0101, Japan
K. Hattori: Graduate School of Materials Science, Nara Institute of Science and Technology (NAIST), Ikoma, Nara 630-0101, Japan
H. Daimon: Graduate School of Materials Science, Nara Institute of Science and Technology (NAIST), Ikoma, Nara 630-0101, Japan
M. Kotsugi: Division of Material Physics, Graduate School of Engineering Science, Osaka University, Toyonaka, Osaka 560-8531, Japan
S. Suga: Division of Material Physics, Graduate School of Engineering Science, Osaka University, Toyonaka, Osaka 560-8531, Japan
T. Nakatani: Japan Synchrotron Radiation Research Institute (JASRI), Sayo-gun, Hyogo 679-5148, Japan
T. Matsushita: Japan Synchrotron Radiation Research Institute (JASRI), Sayo-gun, Hyogo 679-5148, Japan

Surface Review and Letters (SRL), 2000, vol. 07, issue 05n06, 643-647

Abstract: Circular dichroism has been measured in the photoelectron diffraction of bulk W 4f photoelectrons from the W(110)(1×1) clean surface. The forward focusing peaks along the symmetric axis in the diffraction pattern showed an azimuthal rotation similar to those reported in a prior experiment on Si(001) and chemically shifted W 4f photoelectrons from the W(110)(1×1)-O surface. The emission angle dependence of the rotation angles has been measured and analyzed for the first time and the angles observed are in good agreement with those calculated using the formulaΔ ϕ=m/kRsin2θderived previously by Daimonet al.[Jpn. J. Phys.32, L1480 (1993)] considering the angular dependence ofm. This property gives a basis for the analysis of structure or various magnetic and electronic properties on surfaces.

Date: 2000
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DOI: 10.1142/S0218625X00000622

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