OBSERVATION OF DIRECT-CURRENT-INDUCED STEP BENDING PATTERNS ONSi(001)

J.-F. Nielsen, J. P. Pelz and M. S. Pettersen
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J.-F. Nielsen: Department of Physics, The Ohio State University, Columbus, Ohio 43210, USA
J. P. Pelz: Department of Physics, The Ohio State University, Columbus, Ohio 43210, USA
M. S. Pettersen: Department of Physics and Astronomy, Otterbein College, Westerville, Ohio 43081, USA

Surface Review and Letters (SRL), 2000, vol. 07, issue 05n06, 577-582

Abstract: Atomic force microscopy and optical microscopy were used to observe a novel "step bending" instability on vicinal Si(001) surfaces heated with direct current along a direction. This instability occurs on areas where the applied current is parallel to the average step direction and consists of wavy step undulations with a nonzero phase shift between adjacent steps, consistent with theoretical predictions by Liuet al.[Phys. Rev. Lett.81, 2743 (1998)]. The resulting "bands" of high step density run obliquely to the direction of the applied current. These step patterns were observed on spherically dimpled surfaces, which also exhibit a variety of other electromigration-induced instabilities.

Date: 2000
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DOI: 10.1142/S0218625X00000713

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