INVESTIGATION OF THE DEGRADATION MECHANISM OF FIELD-EMITTER ARRAYS
Jing Yuan,
Li de-Jie and
Bing-Chu Du
Additional contact information
Jing Yuan: Department of Electronic Engineering, Tsinghua University, Beijing 100084, China
Li de-Jie: Department of Electronic Engineering, Tsinghua University, Beijing 100084, China
Bing-Chu Du: Department of Electronic Engineering, Tsinghua University, Beijing 100084, China
Surface Review and Letters (SRL), 2001, vol. 08, issue 06, 699-702
Abstract:
There are three primary explanations for the degradation mechanism of field-emitter arrays (FEA's): oxidation, sputtering damage and ion implantation. Theoretical analysis and calculation are carried out in this paper to investigate the issue deeply. Adsorption and oxidation of FEA's fit best the experimental phenomenon and are the most reasonable causes for it. The process of adsorption and oxidation is described and directions for further experiments are suggested.
Date: 2001
References: Add references at CitEc
Citations:
Downloads: (external link)
http://www.worldscientific.com/doi/abs/10.1142/S0218625X01001658
Access to full text is restricted to subscribers
Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.
Export reference: BibTeX
RIS (EndNote, ProCite, RefMan)
HTML/Text
Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:08:y:2001:i:06:n:s0218625x01001658
Ordering information: This journal article can be ordered from
DOI: 10.1142/S0218625X01001658
Access Statistics for this article
Surface Review and Letters (SRL) is currently edited by S Y Tong
More articles in Surface Review and Letters (SRL) from World Scientific Publishing Co. Pte. Ltd.
Bibliographic data for series maintained by Tai Tone Lim ().