DIFFERENTIAL INTERFERENCE CONTRAST FOR X-RAY MICROSCOPY: FABRICATION AND CHARACTERIZATION OF TWIN ZONE PLATE OPTICS

Enzo Di Fabrizio, Burkhard Kaulich, Thomas Wilhein and Jean Susini
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Enzo Di Fabrizio: LILIT, TASC-INFM, S.S.14 km 163.5 in Area Science Park, I-34012 Basovizza – Trieste, Italy
Burkhard Kaulich: X-Ray Microscopy Section, ELETTRA – Sincrotrone Trieste, S.S.14 km 163.5 in Area Science Park, I-34012 Basovizza – Trieste, Italy
Thomas Wilhein: RheinAhrCampus Remagen, University of Applied Sciences, Suedallee 2, D-53424 Remagen, Germany
Jean Susini: ID21 X-Ray Microscopy Beamline, ESRF, BP 220, F-34073 Grenoble Cedex, France

Surface Review and Letters (SRL), 2002, vol. 09, issue 01, 243-248

Abstract: A novel X-ray technique for converting the phase information of weakly absorbing specimen into strong image contrast similar to Nomarski differential interference contrast (DIC) is presented. DIC for X-rays is accomplished by the fabrication of a novel X-ray optic (TZP) consisting of two zone plates (ZPs) on both sides of the same substrate, laterally shifted by about one outermost zone width. The feasibility of DIC for X-rays was proven at the ID 21 X-ray microscopy beamline at the ESRF using a full-field imaging microscopeanda scanning transmission X-ray microscope, which were operated at 4 keV photon energy. In both microscopes, we observe a tremendous contrast enhancement of up to a factor of 25. Though first experiments were carried out at 4 keV photon energy, this X-ray DIC technique can be adapted to any photon energy where ZPs with appropriate parameters and imaging performance can be designed and manufactured.

Date: 2002
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DOI: 10.1142/S0218625X02001720

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