X-RAY MAGNETIC CIRCULAR DICHROISM IMAGING IN A LOW ENERGY ELECTRON MICROSCOPE

A. Locatelli, S. Cherifi, S. Heun, M. Marsi, K. Ono, A. Pavlovska and E. Bauer ()
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A. Locatelli: Sincrotrone Trieste, S.S.14, km 163.5, 34012 Basovizza, Trieste, Italy
S. Cherifi: Sincrotrone Trieste, S.S.14, km 163.5, 34012 Basovizza, Trieste, Italy;
S. Heun: Sincrotrone Trieste, S.S.14, km 163.5, 34012 Basovizza, Trieste, Italy
M. Marsi: Sincrotrone Trieste, S.S.14, km 163.5, 34012 Basovizza, Trieste, Italy
K. Ono: Graduate School of Engineering, University of Tokyo, Tokyo 113-8656, Japan
A. Pavlovska: Sincrotrone Trieste, S.S.14, km 163.5, 34012 Basovizza, Trieste, Italy;
E. Bauer: Sincrotrone Trieste, S.S.14, km 163.5, 34012 Basovizza, Trieste, Italy;

Surface Review and Letters (SRL), 2002, vol. 09, issue 01, 171-176

Abstract: The magnetic domain structure of patterned permalloy films and of a Co(0001) single crystal surface are studied with elliptically polarized light from the new nanospectroscopy beamline at ELETTRA in a low energy electron microscope, using it as a diagnostic tool in the commissioning phase of the beamline. Mirror and low energy electron microscopy as well as low energy electron diffraction are shown to be valuable fast techniques for system alignment and specimen characterization.

Date: 2002
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DOI: 10.1142/S0218625X02001896

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