PHOTODEGRADATION OF POLY(TETRAFLUOROETHYLENE) AND POLY(VINYLIDENE FLUORIDE) THIN FILMS BY INNER SHELL EXCITATION

Koji K. Okudaira, Hiroyuki Yamane, Kazuyuki Ito, Motoyasu Imamura, Shinji Hasegawa and Nobuo Ueno
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Koji K. Okudaira: Graduate School of Science and Technology, Chiba University, 1-33 yayoi-cho, Inage-ku, Chiba 263-8522, Japan;
Hiroyuki Yamane: Graduate School of Science and Technology, Chiba University, 1-33 yayoi-cho, Inage-ku, Chiba 263-8522, Japan;
Kazuyuki Ito: Graduate School of Science and Technology, Chiba University, 1-33 yayoi-cho, Inage-ku, Chiba 263-8522, Japan;
Motoyasu Imamura: National Institute of Materials and Chemical Research, Tsukuba, Ibaraki 305-8565, Japan
Shinji Hasegawa: Institute for Molecular Science, Okazaki 444-8585, Japan
Nobuo Ueno: Department of Materials Technology, Faculty of Engineering, Chiba University, 1-33 yayoi-cho, Inage-ku, Chiba 263-8522, Japan

Surface Review and Letters (SRL), 2002, vol. 09, issue 01, 335-340

Abstract: Ion time-of-flight (TOF) mass spectra of poly(tetrafluoroethylene) (PTFE) and poly(vinylidene fluoride) (PVDF) thin films near fluorine and carbon K-edges were observed. For PTFE thin films, peaks corresponding toF+,CF+, and${\rm CF}^+_3$appeared, while for PVDFF+andH+were mainly observed. They indicate that for PTFE the polymer chain (C–C bonds) as well as C–F bonds are broken by irradiation of photons near fluorine and carbon K-edges, while for PVDF the bond scission occurs mainly at the C–F and C–H bond. Partial ion yields (PIY) of these ions for PTFE and PVDF thin films show strong photon energy dependencies near fluorine and carbon K-edges. The excitation from fluorine 1s toσ(C–F)*is specially efficient forF+ion production for both PTFE and PVDF.

Date: 2002
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DOI: 10.1142/S0218625X02002294

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