OPTICAL COMPONENTS FOR POLARIZATION ANALYSIS AT THE VANADIUML3EDGE AND THE CARBON K EDGE

H. Grimmer, O. Zaharko, M. Horisberger, H.-Ch. Mertins and F. Schäfers
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H. Grimmer: Paul Scherrer Institute, Laboratory for Neutron Scattering, CH-5234 Villigen PSI, Switzerland
O. Zaharko: Paul Scherrer Institute, Laboratory for Neutron Scattering, CH-5234 Villigen PSI, Switzerland
M. Horisberger: Paul Scherrer Institute, Laboratory for Neutron Scattering, CH-5234 Villigen PSI, Switzerland
H.-Ch. Mertins: BESSY, Albert-Einstein-Strasse 15, D-12489 Berlin, Germany
F. Schäfers: BESSY, Albert-Einstein-Strasse 15, D-12489 Berlin, Germany

Surface Review and Letters (SRL), 2002, vol. 09, issue 01, 481-485

Abstract: A complete polarization analysis of soft X-ray radiation with primary standards can be performed using a phase shifter in transmission and an analyzer in reflection. V/Ni multilayers produced at PSI by sputter deposition showed a phase shift|△| = 7.6°at 512 eV and a reflectance ratioRs/Rp> 1000forEin the range 507–512 eV. For Cr/C multilayers a phase shift|△| = 21°was found at 277 eV andRs= 20%,Rs/Rp= 1400at 278 eV. The values show that these components are suitable for polarization analysis at the mentioned energies.

Date: 2002
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DOI: 10.1142/S0218625X0200249X

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