HIGH SPATIAL RESOLUTION SOFT X-RAY PHOTOEMISSION STUDY OFWO3THIN FILMS

L. Lozzi, M. Passacantando, S. Santucci, S. La Rosa and N. Yu. Svetchnikov
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L. Lozzi: INFM and Department of Physics, University of L'Aquila, via Vetoio, 67010 Coppito, L'Aquila, Italy
M. Passacantando: INFM and Department of Physics, University of L'Aquila, via Vetoio, 67010 Coppito, L'Aquila, Italy
S. Santucci: INFM and Department of Physics, University of L'Aquila, via Vetoio, 67010 Coppito, L'Aquila, Italy
S. La Rosa: Sincrotrone Trieste S.p.A., Trieste, Italy
N. Yu. Svetchnikov: Sincrotrone Trieste S.p.A., Trieste, Italy

Surface Review and Letters (SRL), 2002, vol. 09, issue 01, 375-380

Abstract: WO3thin film surface chemical composition has been studied by means of high resolution soft X-ray photoemission spectroscopy. Valence band and W 4f core levels have been analyzed on different sample positions and high lateral resolution images have been acquired. The valence band spectra have shown for the first time a marked increase of the W 5d density of state at the Fermi level, indicating the presence of metallic tungsten on the surface. This has been confirmed by the W 4f signal, which presents both metallic and oxidized phases. For the first time, spectromicroscopy on core states has clearly evidenced the presence of nonstoichiometric areas and a spatial localization ofW4+states on the surface.

Date: 2002
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DOI: 10.1142/S0218625X02002518

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