DESIGN OF A FLAT FIELD SPECTROMETER FOR SOFT X-RAY EMISSION SPECTROSCOPY
T. Tokushima,
Y. Harada,
M. Watanabe,
Y. Takata,
E. Ishiguro,
A. Hiraya and
S. Shin
Additional contact information
T. Tokushima: RIKEN/SPring-8, 1-1-1 Kouto, Mikazuki-cho, Sayo-gun, Hyogo 679-5148, Japan;
Y. Harada: RIKEN/SPring-8, 1-1-1 Kouto, Mikazuki-cho, Sayo-gun, Hyogo 679-5148, Japan
M. Watanabe: RIKEN/SPring-8, 1-1-1 Kouto, Mikazuki-cho, Sayo-gun, Hyogo 679-5148, Japan
Y. Takata: RIKEN/SPring-8, 1-1-1 Kouto, Mikazuki-cho, Sayo-gun, Hyogo 679-5148, Japan
E. Ishiguro: University of the Ryukyus, 1 Senbaru, Nishihara, Okinawa 903-0213, Japan
A. Hiraya: Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima, Hiroshima 739-8526, Japan
S. Shin: RIKEN/SPring-8, 1-1-1 Kouto, Mikazuki-cho, Sayo-gun, Hyogo 679-5148, Japan;
Surface Review and Letters (SRL), 2002, vol. 09, issue 01, 503-508
Abstract:
A spectrometer for soft X-ray emission spectroscopy was designed and constructed. The aims of this spectrometer are high detection efficiency and realizing the energy resolution of 1000(E/ΔE)in a compact size. To satisfy these requirements, a flat field spectrometer with a varied line spacing grating and a CCD detector was chosen. Furthermore, the configuration without the entrance slit was employed. For compact flat field spectrometers, the spectral dispersion on the detector is sometimes smaller than the spatial resolution of existing detectors restricting maximum energy resolution. The spectral dispersion on the detector was optimized to balance with the spatial resolution of CCD. Optical performance was tested with a ray-tracing program. The spectrometer covers 250–900 eV, with two gratings. Taking into account the spatial resolution of a CCD detector, the maximum energy resolution of the spectrometer is estimated to be about 1000(E/ΔE)for the beam size of 10 μm. Using the constructed spectrometer, test experiments were performed at the beamline BL27SU in SPring-8.
Date: 2002
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Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:09:y:2002:i:01:n:s0218625x02002567
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DOI: 10.1142/S0218625X02002567
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