MICROSCOPIC ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY USING He-I AND He-II RESONANCE LINES

Yuzi Kondo (), Takeo Ejima, Hirofumi Takatsuka and Makoto Watanabe
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Yuzi Kondo: Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
Takeo Ejima: Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
Hirofumi Takatsuka: Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
Makoto Watanabe: Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan

Surface Review and Letters (SRL), 2002, vol. 09, issue 01, 521-527

Abstract: A microscopic ultraviolet photoelectron spectrometer (micro-UPS) is developed using a Schwarzschild objective coated with the two-color multilayer which reflects efficiently both He-I (21.2 eV) and He-II (40.8 eV) resonance lines. The spot size by the use of a pinhole of 300 μm diameter is 5 μm, which was measured using the visible light from a Xe lamp. In the present micro-UPS, a pinhole of 2 mm diameter is used to gain sufficient photon intensity, so that the spot size is 25 μm. The valence band spectra of aNiWO4microcrystal, which cannot be grown in sufficient size, were measured by the present micro-UPS. The origin of atomic orbitals constituting the valence band ofNiWO4was elucidated.

Date: 2002
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DOI: 10.1142/S0218625X02002580

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