A NOVEL APPARATUS FOR LASER-EXCITED TIME-RESOLVED PHOTOEMISSION SPECTROSCOPY

G. Paolicelli, A. Fondacaro, A. Ruocco, A. Attili, G. Stefani, G. Ferrini, M. Peloi, F. Parmigiani, G. Banfi, G. Cautero, R. Tommasini, G. Comelli and R. Rosei
Additional contact information
G. Paolicelli: INFM, Research Unit of Roma TRE, Via della Vasca Navale 84 – I 00146 Roma, Italy
A. Fondacaro: INFM, Research Unit of Roma TRE, Via della Vasca Navale 84 – I 00146 Roma, Italy
A. Ruocco: INFM and Department of Physics, University of Roma TRE – I 00146 Roma, Italy
A. Attili: INFM and Department of Physics, University of Roma TRE – I 00146 Roma, Italy
G. Stefani: INFM and Department of Physics, University of Roma TRE – I 00146 Roma, Italy
G. Ferrini: INFM and Department of Mathematics and Physics, The Cattolica University – I 25121 Brescia, Italy
M. Peloi: INFM and Department of Mathematics and Physics, The Cattolica University – I 25121 Brescia, Italy
F. Parmigiani: INFM and Department of Mathematics and Physics, The Cattolica University – I 25121 Brescia, Italy
G. Banfi: INFM and Department of Electronics, University of Pavia – I 27100 Pavia, Italy
G. Cautero: Sincrotrone Trieste S.C.p.A – I 34012 Basovizza, Trieste, Italy
R. Tommasini: Sincrotrone Trieste S.C.p.A – I 34012 Basovizza, Trieste, Italy
G. Comelli: INFM and Department of Physics, University of Trieste – I 34000 Trieste, Italy
R. Rosei: INFM and Department of Physics, University of Trieste – I 34000 Trieste, Italy

Surface Review and Letters (SRL), 2002, vol. 09, issue 01, 541-547

Abstract: A novel apparatus devoted to time-resolved photoemission experiments in the sub-picosecond regime will be presented. The system is composed of a Ti:sapphire laser source and a time of flight (TOF) electron energy analyzer mounted in a UHV experimental chamber. The laser source is characterized by a pulse duration of 150 fs at a wavelength of 790 nm (1.57 eV) and operates at a repetition rate of 1 kHz. To perform photoemission measurements, UV radiation up to 6.28 eV is produced with sequential steps of frequency conversion by employing crystals with a second order nonlinearity. Photoelectrons are collected by a TOF spectrometer designed to analyze electrons from tenths of eV up to 5 eV. It can be operated in two different angular resolution modes switching on and off an electrostatic collection optics: the high angular resolution mode(Δα = ±2.7°)and the low angular resolution mode(Δα = ±5.6°). Single photon photoemission spectra from the Ag(100) clean surface have been recorded at room temperature using the fourth harmonic light (λ = 200 nm andhν = 6.28eV). The Fermi edge profile convoluted with a Gaussian-shaped energy transmission function of the TOF spectrometer sets an upper limit for the energy resolution which is about 65 meV (FWHM) at 2 eV of electron energy.

Date: 2002
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DOI: 10.1142/S0218625X02002610

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